Error Analysis for Stress Component Characterization Based on Polarized Raman Spectroscopy
Tóm tắt
Raman spectroscopy has become an effective experimental stress analysis method because of its high spatial resolution, nondestructive and noncontact, etc. However, the stress confidence of single point and single time detection is far from accurate. Especially for the component decoupling analysis of complex stress states, the characterization results of the stress components often have difficulty reflecting the real stress states. In this paper, based on stress characterization using polarized micro-Raman spectroscopy, we focus on the two main factors that affect the confidence of the Raman spectrum, namely, the frequency shift repeatability of the instrument and the polarization control accuracy. Through a combination of physical experiments and numerical ones, the influence of random error in the Raman measurement system, initial error and random error in the polarization angle on the decoupling characterization of the stress component is quantitatively analyzed. The results show that due to the existence of various error factors and the influence of polarization angle combinations, the error levels for the characterization results for each stress component are not only difficult to ignore but also the difference is obvious, and the true stress state of the sample surface cannot be accurately analyzed. In particular, the influence of the random error in the polarization angle on the characterization results obtained for the stress component is dominant. Although various experimental error sources are difficult to eliminate, the influence of the above factors on the characterization of stress components can be effectively weakened by improving the experimental design and analysis method.
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