Enhancement of flip-chip fatigue life by encapsulation

Institute of Electrical and Electronics Engineers (IEEE) - Tập 14 Số 1 - Trang 218-223 - 1991
D. Suryanarayana1, R. Hsiao1, T.P. Gall1, J.M. McCreary1
1IBM Corporation, Endicott, NY, USA

Tóm tắt

Từ khóa


Tài liệu tham khảo

10.1147/rd.263.0372

10.1063/1.1137679

1986, Solder Interconnection Structure for Joining Semiconductor Devices to Substrates that have Improved Fatigue Life and Process for Making

may, 1978, A new physical mechanism for soft errors in dynamic memories, Proc Int Rel Phys Symp, 33

howard, 1981, Characterization of low alpha-particle emissions from semiconductor memory materials, J Electron Mat, 10, 747, 10.1007/BF02660131

nakano, 1987, Resin-insertion effect on thermal cycle resistivity of flip chip mounted LSI devices, ISHM Proc, 536

1989, Semiconductor Resin Package Structure

hatada, 1987, Insulation resin bonding?chip on substrate assembly technology, ICIC

ichikawa, 1988, Flip-chip joining technique for 400DPI thermal printheads, OKI Tech Rev, 55, 18

gabrykewicz, 1986, Glob top material selection for flip chip devices, Proc 1986 Int Symp on Microelectronics, 707

10.1016/0022-3697(84)90048-9

10.1147/rd.255.0617

10.1147/rd.133.0251

10.1007/978-1-4613-1069-3_6

10.1109/TCHMT.1987.1134795

10.1147/rd.263.0372

1989, Microelectronics Packaging Handbook

10.1147/rd.133.0226

1987

10.1115/1.2904385