Enhanced magneto-optic imaging system for nondestructive evaluation

NDT & E International - Tập 40 - Trang 374-377 - 2007
Yu Hua Cheng1, Zhao Fei Zhou1, Gui Yun Tian2
1School of Manufacturing Science and Engineering, Sichuan University, Chengdu 610065, China
2School of Automation, Nanjing University of Aeronautronics and Astronautronics, Nanjing, China

Tài liệu tham khảo

Grimberg, 2006, 2D Eddy current sensor array, Nondestr Test Eval Int, 39, 264 Yamasa, 2005, Conductive microbead array detection by high-frequency eddy-current testing technique with SV-GMR sensor, IEEE Trans Magn, 41, 3622, 10.1109/TMAG.2005.855172 Smith, 2004, Hall sensor arrays for rapid large-area transient eddy current inspection, Insight, 46, 142, 10.1784/insi.46.3.142.55523 Bowler, 2004, Magnetic sensor array for eddy current field measurement with a racetrack coil excitation Tian, 2005, Multiple sesnors on pulsed eddy current detection for 3D subsurface crack assessment, IEEE Sensors J, 5, 90, 10.1109/JSEN.2004.839129 Tian GY, Li Y, Cui Z. Magnetically actuated micromirrors for electromagnetic NDE. In: Proceedings of the 7th ICFDM2006 international conference on frontiers of design and manufacturing. Guangzhou, China, June 19–22, 2006. p. 243–8. Cheng, 2006, Application of the magneto-optic Faraday Effect in NDT’, Insight, 48, 290, 10.1784/insi.2006.48.5.290 Sophian, 2006, Pulsed magnetic flux leakage probe for crack detection and characterisation, Sensors Actuators A: Phys, 125, 186, 10.1016/j.sna.2005.07.013 Tian, 2005, Study of magnetic sensors for pulsed eddy current techniques, Insight, 47, 277, 10.1784/insi.47.5.277.65048 Yang, 2000, Real-time observation and measurement of a magneto-optic recorded domain using an image processing technique, Mater Sci Eng B, 76, 47, 10.1016/S0921-5107(00)00395-0 Novotný, 2002, On the application of magneto-optic films in NDE[J], Nondestr Test Eval Int, 35, 227 Park, 2004, Motion-based filtering of magneto-optic imagers, Image Vision Comput, 22, 243, 10.1016/j.imavis.2003.10.001 Yin Y, Tian GY, Luo AM. Defect edge reconstruction based on region growing using the Hausdorff distance. In: Proceedings of BINDT 2006.