Empirical analysis of network measures for predicting high severity software faults

Springer Science and Business Media LLC - Tập 59 Số 12 - 2016
Lin Chen1, Wei Ma1, Yuming Zhou1, Lei Xu1, Ziyuan Wang2, Zhifei Chen1, Baowen Xu1
1State Key Laboratory for Novel Software Technology, Nanjing University, Nanjing 210023, China
2School of Computer Science and Technology, Nanjing University of Posts and Telecommunications, Nanjing 210023, China

Tóm tắt

Từ khóa


Tài liệu tham khảo

Zhou Y, Leung H. Empirical analysis of object-oriented design metrics for predicting high and low severity faults. IEEE Trans Softw Eng, 2006, 32: 771–789

Chhillar R S, Nisha. Empirical analysis of object-oriented design metrics for predicting high, medium and low severity faults using mallows Cp. ACM SIGSOFT Softw Eng Notes, 2011, 36: 1–9

Basili V R, Briand L C, Melo W L. A validation of object-oriented design metrics as quality indicators. IEEE Trans Softw Eng, 1996, 22: 751–761

Subramanyam R, Krishnan M S. Empirical analysis of ck metrics for object-oriented design complexity: implications for software defects. IEEE Trans Softw Eng, 2003, 29: 297–310

Nagappan N, Ball T, Zeller A. Mining metrics to predict component failures. In: Proceedings of the 28th International Conference on Software Engineering. New York: ACM, 2006. 452–461

Zhang H Y. An investigation of the relationships between lines of code and defects. In: Proceedings of 2009 IEEE International Conference on Software Maintenance. Piscataway: IEEE, 2009. 274–283

Nagappan N, Ball T. Use of relative code churn measures to predict system defect density. In: Proceedings of the 27th International Conference on Software Engineering. Piscataway: IEEE, 2005. 284–292

Moser R, Pedrycz W, Succi G. A comparative analysis of the efficiency of change metrics and static code attributes for defect prediction. In: Proceedings of the 30th International Conference on Software Engineering. Piscataway: IEEE, 2008. 181–190

Hassan A E. Predicting faults using the complexity of code changes. In: Proceedings of the 31st International Conference on Software Engineering. Piscataway: IEEE, 2009. 78–88

Hassan A E, Holt R C. The top ten list: dynamic fault prediction. In: Proceedings of the 21st IEEE International Conference on Software Maintenance. Piscataway: IEEE, 2005. 263–272

Ostrand T J, Weyuker E J, Bell R M. Predicting the location and number of faults in large software systems. IEEE Trans Softw Eng, 2005, 31: 340–355

Zhang W Q, Nie L M, Jiang H, et al. Developer social networks in software engineering: construction, analysis, and applications. Sci China Inf Sci, 2014, 57: 121101

Zimmermann T, Nagappan N. Predicting defects with program dependencies. In: Proceedings of the 3rd International Symposium on Empirical Software Engineering and Measurement. Piscataway: IEEE, 2009: 435–438

Zimmermann T, Nagappan N. Predicting defects using network analysis on dependency graphs. In: Proceedings of the 30th International Conference on Software Engineering. New York: ACM, 2008. 531–540

Taba S E S, Khomh F, Zou Y, et al. Predicting bugs using antipatterns. In: Proceedings of the 29th IEEE International Conference on Software Maintenance. Piscataway: IEEE, 2013. 270–279

Tosun A, Turhan B, Bener A. Validation of network measures as indicators of defective modules in software systems. In: Proceedings of the 5th International Conference on Predictor Models in Software Engineering. New York: ACM, 2009. 1–5

Premraj R, Herzig K. Network versus code metrics to predict defects: a replication study. In: Proceedings of the 5th International Symposium on Empirical Software Engineering and Measurement. Piscataway: IEEE, 2011. 215–224

Nguyen T H D, Adams B, Hassan A E. Studying the impact of dependency network measures on software quality. In: Proceedings of the 2010 IEEE International Conference on Software Maintenance. Piscataway: IEEE, 2010. 1–10

Ma Y, He K, Li B, et al. How multiple-dependency structure of classes affects their functions a statistical perspective. In: Proceedings of the 2nd International Conference on Software Technology and Engineering. Piscataway: IEEE, 2010, v2: 60–66

Basili V R, Shull F, Lanubile F. Building knowledge through families of experiments. IEEE Trans Softw Eng, 1999, 25: 456–473

Halstead M H. Elements of Software Science. New York: Elsevier, 1977. 50–70

Chidamber S R, Kemerer C F. A metrics suite for object oriented design. IEEE Trans Softw Eng, 1994, 20: 476–493

Hosmer Jr D W, Lemeshow S. Applied Logistic Regression. New Jersey: John Wiley & Sons, 2004. 153–223

Belsley D A, Kuh E, Welsch R E. Regression Diagnostics: Identifying Influential Data and Sources of Collinearity. New Jersey: John Wiley & Sons, 2005. 6–38

Harrell F E. Regression Modeling Strategies: With Applications to Linear Models, Logistic Regression, and Survival Analysis. New York: Springer, 2001. 215–268

Kutner M H, Nachtsheim C, Neter J. Applied Linear Regression Models. 4th ed. Chicago: Irwin, 2004. 20–70

Maddala G S. Limited-Dependent and Qualitative Variables in Econometrics. New York: Cambridge University Press, 1983. 100–124

Nagelkerke N J D. A note on a general definition of the coefficient of determination. Biometrika, 1991, 78: 691–692

Benjamini Y, Hochberg Y. Controlling the false discovery rate: a practical and powerful approach to multiple testing. J Royal Stat Soc Ser B (Methodological), 1995, 57: 289–300

Freeman E A, Moisen G G. A comparison of the performance of threshold criteria for binary classification in terms of predicted prevalence and kappa. Ecol Model, 2008, 217: 48–58

He Z, Shu F, Yang Y, et al. An investigation on the feasibility of cross-project defect prediction. Autom Softw Eng, 2012, 19: 167–199

Chang R H, Mu X D, Zhang L. Software defect prediction using non-negative matrix factorization. J Softw, 2011, 6: 2114–2120

Yin R K. Case Study Research: Design and Methods. 3rd ed. New York: SAGE Publications, 2002. 120–180

Kim S, Zhang H, Wu R, et al. Dealing with noise in defect prediction. In: Proceedings of the 33rd International Conference on Software Engineering. Piscataway: IEEE, 2011. 481–490

Zhou Y, Xu B, Leung H. On the ability of complexity metrics to predict fault-prone classes in object-oriented systems. J Syst Softw, 2010, 83: 660–674

Zhou Y, Leung H, Xu B. Examining the potentially confounding effect of class size on the associations between object-oriented Metrics and change-proneness. IEEE Trans Softw Eng, 2009, 35: 607–623

Pan K, Kim S, Whitehead E J. Bug classification using program slicing metrics. In: Proceedings of the 6th International Working Conference on Source Code Analysis and Manipulation, Philadelphia, 2006. 31–42

Koru A G, Tian J. Comparing high-change modules and modules with the highest measurement values in two large-scale open-source products. IEEE Trans Softw Eng, 2005, 31: 625–642

Menzies T, Greenwald J, Frank A. Data mining static code attributes to learn defect predictors. IEEE Trans Softw Eng, 2007, 33: 2–13

Singh Y, Kaur A, Malhotra R. Empirical validation of object-oriented metrics for predicting fault proneness models. Softw Qual J, 2010, 18: 3–35

Shatnawi R, Li W. The effectiveness of software metrics in identifying fault-prone classes in post-release software evolution process. J Syst Softw, 2008, 81: 1868–1882