Electrical-Resistivity Model for Polycrystalline Films: the Case of Arbitrary Reflection at External Surfaces

American Physical Society (APS) - Tập 1 Số 4 - Trang 1382-1389
A. F. Mayadas1, M. Shatzkes2
1IBM Watson Research Center, Yorktown Heights, New York 10598
2IBM Components Division Laboratory, East Fiskhill, New York 12533

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Tài liệu tham khảo

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