Effect of amine catalysts on preparation of nanometric SiO2 particles and antireflective films via sol–gel method

Journal of Sol-Gel Science and Technology - Tập 56 - Trang 167-176 - 2010
Ömer Kesmez1,2, Nadir Kiraz1,2, Esin Burunkaya1,2, H. Erdem Çamurlu3,4, Meltem Asiltürk5, Ertuğrul Arpaç1,2
1Faculty of Science and Art, Department of Chemistry, Akdeniz University, Antalya, Turkey
2NANOen R&D Ltd, Antalya Technopolis, Akdeniz University, Antalya, Turkey
3Department of Mechanical Engineering, Akdeniz University, Antalya, Turkey
4Mattek Advanced Materials Ltd, Antalya Technopolis, Akdeniz University, Antalya, Turkey
5Prof. Dr. Hikmet Sayılkan Research and Development Laboratory for Advanced Materials, İnönü University, Malatya, Turkey

Tóm tắt

SiO2 sols were prepared by hydrolysis and condensation reactions of tetraethyl orthosilicate through a one step acid or a two step acid + base catalysis process, in the presence of nitric acid and four different base catalyzers, namely trimethylamine, triethylamine, tripropylamine and tributylamine. Hydrolysis of TEOS was followed by FT-IR analyses. Particle size distributions of the sols were evaluated after predetermined durations in 1–22 days. Particle growth was seen to be faster in amine catalyzed systems than in one step acid catalyzed system. The highest rate of growth was in triethylamine catalyzed system. Glass substrates were dip coated with the prepared SiO2 sols. Effect of sol aging duration on film thickness and on light transmittance properties of the films was investigated with respect to type of base catalyst. Thicknesses of the films which were measured to be in the range of 100–400 nm, were seen to increase with aging duration of the sols. Triethylamine catalyzed system presented the highest film thickness. Films obtained from one step acid catalyzed system presented an increase of 4.8%; whereas acid + base catalyzed films provided an increase in the light transmittance of 5.7% in the first 4 days of aging. Surfaces of films were examined by FESEM and AFM. The antireflective character of the films was verified by diffuse reflectance analyses.

Tài liệu tham khảo

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