Early detection of valuable patents using a deep learning model: Case of semiconductor industry

Elsevier BV - Tập 158 - Trang 120146 - 2020
Park Chung1, So Young Sohn1
1Department of Information & Industrial Engineering, Yonsei University, 50 Yonsei-ro Seodaemun-gu, Seoul, 03722, Republic of Korea

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