Dynamic analysis of the extended space charge layer using chronopotentiometric measurements

Micro and Nano Systems Letters - Tập 8 - Trang 1-8 - 2020
Inhee Cho1,2, Hyomin Lee3, Sung Jae Kim2,4,5
1Korea-Russia Innovation Center, Korea Institute of Industrial Technology, Incheon, Republic of Korea
2Department of Electrical and Computer Engineering, Seoul National University, Seoul, Republic of Korea
3Department of Chemical and Biological Engineering, Jeju National University, Jeju, Republic of Korea
4Inter-University Semiconductor Research Center, Seoul National University, Seoul, South Korea
5Nano Systems Institute, Seoul National University, Seoul, South Korea

Tóm tắt

In this paper, we experimentally verified the length (LESC) and the concentration (cESC) of the extended space charge (ESC) layer in front of the electrical double layer (EDL) using the chronopotentiometric measurement and the equivalent circuit model analysis. From the experimentation, the coupled-response of the EDL and the ESC layer was discriminated from the contribution of electro-osmotic flow (EOF). In addition, we derived the potential differences across the ESC (VESC) layer using the circuit model of the ICP layer under rigorous consideration of ESC and EDL. As a result, we obtained that VESC was linearly proportional to the square of the applied current (iapplied). Hence, LESC and cESC were quantitatively provided, where LESC is linear to the iapplied and cESC is constant regardless of iapplied. Thus, this experimentation could not only clarify an essential ICP theory but also guide in ESC-based applications.

Tài liệu tham khảo

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