Double-Tip Artifact Removal From Atomic Force Microscopy Images

IEEE Transactions on Image Processing - Tập 25 Số 6 - Trang 2774-2788 - 2016
Yunfeng Wang1, Jason I. Kilpatrick2, Suzanne Jarvis3, Frank Boland1, Anil Kokaram1, David Corrigan1
1Department of Electronic and Electrical Engineering, Trinity College Dublin, Dublin, Ireland
2Conway Institute of Biomedical and Biomolecular Research, University College, Dublin, Ireland
3University College Dublin, Dublin, IE

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