Determining the parameters of the calibration network used for the measurement of transistor characteristics

Measurement Techniques - Tập 18 - Trang 1672-1674 - 1975
A. I. Khar'ko, Ya. N. Druzhilovskii, É. N. Smirnova

Tài liệu tham khảo

Government Standard 18604.1-73 Transistors. Methods of Measuring the Time Constant at a High Frequency [in Russian]. M. G. Agapova et al., Transistors. Methods of Their Testing and Measuring Their Parameters [in Russian]. Izd. Sovetskoe Radio, Moscow (1968).