Determination of optical band gap of ZnO:ZnAl2O4 composite semiconductor nanopowder materials by optical reflectance method

Journal of Electroceramics - Tập 31 - Trang 265-270 - 2013
C. Aydın1, M. Benhaliliba2, Ahmed A. Al-Ghamdi3, Zarah H. Gafer4, Farid El-Tantawy5, F. Yakuphanoglu3,6
1Department of Metallurgy and Materials Engineering, Faculty of Technology, Firat University, Elazig, Turkey
2Physics Department, Sciences Faculty, University of Sciences and Technology USTOMB, Oran, Algeria
3Department of Physics, Faculty of Science, King Abdulaziz University, Jeddah, Saudi Arabia
4Department of Chemistry, Faculty of Science, Khalid University, Abha, Saudi Arabia
5Department of Physics, Faculty of Science, Suez Canal University, Ismailia, Egypt
6Physics Department, Faculty of Science, Firat University, Elazig, Turkey

Tóm tắt

ZnO:ZnAl2O4 composite semiconductor nanopowder materials were synthesized by sol gel method. X-ray diffraction results reveal that Al doped ZnO samples have a polycrystalline hexagonal structure with a = 3.2506 Å, c = 5.2079 Å lattice parameters. The crystallite size of the ZnO samples is decreased with increasing Al content. Atomic force microscope results indicate the presence of micro/nanohexagons with different sizes from 128 to 166 nm. Optical band gap of the ZnO samples is decreased and reaches a low value of 2.82 eV for 20 % Al. The electrical conductivity dependence of temperature confirms that ZnO:ZnAl2O4 composite semiconductor nanopowder materials exhibit semiconductor behavior.

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