Depth profiling of defects in ion-implanted Ni and Fe by positron annihilation measurements

Sizmann, 1978, J. Nucl. Mater., 69&70, 386, 10.1016/0022-3115(78)90256-8 Asoka-Kumar, 1994, J. Appl. Phys., 76, 4935, 10.1063/1.357207 Schultz, 1988, Rev. Mod. Phys., 60, 701, 10.1103/RevModPhys.60.701 Fujinami, 2003, J. Appl. Phys., 94, 4382, 10.1063/1.1606855 Uedono, 1991, Jpn. J. Appl. Phys., 30, 201, 10.1143/JJAP.30.201 Aruga, 1995, Appl. Surf. Sci., 85, 229, 10.1016/0169-4332(94)00336-X Coleman, 1999, Appl. Surf. Sci., 149, 82, 10.1016/S0169-4332(99)00177-4 van Veen, 1995, Appl. Surf. Sci., 85, 216, 10.1016/0169-4332(94)00334-3 Ziegler, 1985 Puska, 1983, J. Phys. F Met. Phys., 13, 333, 10.1088/0305-4608/13/2/009 Vehanen, 1987, Phys. Rev. B, 35, 4606, 10.1103/PhysRevB.35.4606 Puska, 1994, Rev. Mod. Phys., 66, 841, 10.1103/RevModPhys.66.841 Wollenberger, 1983, 1140 Davies, 1968, Canadian J. Phys., 46, 573, 10.1139/p68-071