Correlation between defect chemistry and expansion during reduction of doped LaCrO3 interconnects for SOFCs

Solid State Ionics - Tập 129 - Trang 251-258 - 2000
F Boroomand1, E Wessel1, H Bausinger2, K Hilpert1
1Research Centre Jülich, Institute for Materials and Processes in Energy Systems (IWV-2), 52425 Jülich, Germany
2Daimler Chrysler Aerospace Dornier, Research and Technology, Ceramics FT4/WK, 88039 Friedrichshafen, Germany

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Solid State Ionics

Tập 129

251-258

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