Compound formation and large microstrains at the interface of II-VI/III-V semiconductors detected by Raman spectroscopy

Semiconductor Science and Technology - Tập 6 Số 9A - Trang A109-A114 - 1991
A. Krost1, W. Richter1, Dietrich R. T. Zahn1, O. Brafman1
1Inst. fur Festkorperphys., Tech. Univ. Berlin, Germany

Tóm tắt

Từ khóa


Tài liệu tham khảo

, 1971, 6

10.1063/1.98085

Zahn D R T, 1991, J. Vac. Sci. Technol.

10.1063/1.104149

10.1063/1.103887

Wright P J, 1991, Semicond. Sci. Technol., 6, A29, 10.1088/0268-1242/6/9A/006

10.1016/0022-0248(90)90961-J

Sitter H, 1990, 219

10.1016/0169-4332(89)90109-8

10.1063/1.102803

10.1063/1.346162

10.1103/PhysRevB.36.7674

Matsumoto T, 1987, Japan. J. Appl. Phys., 26, L576, 10.1143/JJAP.26.L576

10.1103/PhysRevB.36.2883

Brafman O, 1971, 284

10.1116/1.584999

10.1103/PhysRevB.5.580

10.1103/PhysRevB.24.741

Kunc K, 1975, Phys. Status Solidi, 72, 229, 10.1002/pssb.2220720125