So sánh các thử nghiệm kéo và thử nghiệm lồi cho nitrua silicon mỏng

Experimental Mechanics - Tập 44 - Trang 49-54 - 2004
R. L. Edwards1, G. Coles2, W. N. Sharpe2
1Applied Physics Laboratory, Johns Hopkins University, Laurel, USA
2[Department of Mechanical Engineering, Johns Hopkins University, Baltimore, USA]

Tóm tắt

Các thuộc tính cơ học của nitrua silicon mỏng được chế tạo bằng phương pháp lắng đọng hơi hóa học ở áp suất thấp đã được đo bằng phương pháp kéo uniaxial và bằng một phương pháp thử nghiệm lồi phù hợp cho việc thử nghiệm cấp độ wafer. Nghiên cứu này so sánh hai phương pháp và trình bày thêm dữ liệu về nitrua silicon. Tính chất chung từ hai phương pháp thử nghiệm là mô đun Young. Các thử nghiệm kéo được thực hiện tại Đại học Johns Hopkins cung cấp một giá trị là 257±5 GPa. Các thử nghiệm lồi được thực hiện bởi Exponent, Inc., một công ty tư vấn kỹ thuật và khoa học, cho giá trị là 258±1 GPa. Kết luận rằng phương pháp thử nghiệm lồi này là một phương pháp thử nghiệm hợp lệ ở cấp độ wafer. Những kết quả kéo này, khi được cộng thêm với các kết quả trước đó, cho ra các thuộc tính sau cho nitrua silicon chịu stress thấp: mô đun Young = 255±5 GPa, tỷ lệ Poisson = 0.23±0.02, và sức bền gãy = 5.87±0.62 GPa.

Từ khóa

#nitrua silicon; thử nghiệm kéo; thử nghiệm lồi; mô đun Young; tỷ lệ Poisson; sức bền gãy

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