Characterization of vapor phase growth using X-ray techniques

Journal of Crystal Growth - Tập 146 - Trang 104-111 - 1995
D.W. Kisker1, G.B. Stephenson1, P.H. Fuoss2, S. Brennan3
1IBM Research Division, Yorktown Heights, New York 10598, USA
2AT&T Bell Laboratories, Murray Hill, New Jersey 07974 USA
3Stanford Synchrotron Radiation Laboratory, Menlo Park, California 94025, USA

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