Characterization of a-Si:H and a-SiGe:H p-i-n and Schottky junctions by admittance circuit modeling

IEEE Transactions on Electron Devices - Tập 39 Số 10 - Trang 2368-2376 - 1992
Steven Hegedus1, E. A. Fagen1
1Delaware Univ., Newark, DE, , USA

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Tài liệu tham khảo

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