Carrier grain boundary scattering in thermoelectric materials

Energy and Environmental Science - Tập 15 Số 4 - Trang 1406-1422
Chaoliang Hu1, Kaiyang Xia1, Chenguang Fu1, Xinbing Zhao1, Tiejun Zhu1
1State Key Laboratory of Silicon Materials and School of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, China

Tóm tắt

This review gives a comprehensive understanding of carrier grain boundary scattering in thermoelectric materials. Moreover, the difference between grain boundary scattering and ionized impurity scattering and how to distinguish them are highlighted.

Từ khóa


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Energy and Environmental Science

Tập 15 Số 4

1406-1422

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