Carrier concentration dependence of optical Kerr nonlinearity in indium tin oxide films
Tóm tắt
Optical Kerr nonlinearity (n2) in n-type indium tin oxide (ITO) films coated on glass substrates has been measured using Z-scans with 200-fs laser pulses at wavelengths ranging from 720 to 780 nm. The magnitudes of the measured nonlinearity in the ITO films were found to be dependent on the carrier concentration with a maximum n2-value of 4.1×10-5 cm2/GW at 720-nm wavelength and an electron density of Nd=5.8×1020 cm-3. The Kerr nonlinearity was also observed to be varied with the laser wavelength. By employing a femtosecond time-resolved optical Kerr effect (OKE) technique, the relaxation time of OKE in the ITO films is determined to be ∼1 ps. These findings suggest that the Kerr nonlinearity in ITO can be tailored by controlling the carrier concentration, which should be highly desirable in optoelectronic devices for ultrafast all-optical switching.
Tài liệu tham khảo
Kawazoe H, Yasukawa M, Hyodo H, Kurita M, Yanagi H, Hosono H (1997) Nature 389:939
Metz AW, Ireland JR, Zheng JG, Lobo RPSM, Yang Y, Ni J, Stern CL, Dravid VP, Bontemps N, Kannewurf CR, Poeppelmeier KR, Marks TJ (2004) J. Am. Chem. Soc. 126:8477
Chopra KL, Major S, Pandya DK (1983) Thin Solid Films 102:1
Mar LG, Timbrell PY, Lamb RN (1993) Thin Solid Films 223:341
Karasawa T, Miyata Y (1993) Thin Solid Films 223:135
Ishida T, Kobayashi H, Nakato Y (1993) J. Appl. Phys. 73:4344
Major S, Chopra KL (1988) Sol. Energ. Mat. 17:319
Hu J, Gordon RG (1992) J. Appl. Phys. 72:5381
Zhang K, Zhu FR, Huan CHA, Wee ATS (1999) J. Appl. Phys. 86:974
Hamburg I, Granqvist CG (1986) J. Appl. Phys. 60:R123
Tahar RBH, Ban T, Ohya Y, Takahashi Y (1998) J. Appl. Phys. 83:2631
Studenikin SA, Cocivera M (2002) J. Appl. Phys. 91:5060
Zhang K, Zhu FR, Huan CHA, Wee ATS (2000) Thin Solid Films 376:255
Sheik-Bahae M, Said AA, Wei T, Hagan DJ, Van Stryland EW (1990) IEEE J. Quantum Electron. 26:760
Sasajima Y, Taimura K (2003) Phys Rev. B 68:014204
Catalano IM, Cingolani A, Minafra A (1975) Solid State Commun. 16:417
Adair R, Chase LL, Payne SA (1989) Phys. Rev. B 39:3337
Mayer A, Keilmann F (1986) Phys. Rev. B 33:6962
He J, Ji W, Ma GH, Tang SH, Kong ESW, Chow SY, Zhang XH, Hua ZL, Shi JL (2005) J. Phys. Chem. B 109:4373
Lenz G, Zimmerman J, Katsufuji T, Lines ME, Hwang HY, Spalter S, Slusher RE, Cheong S-W, Sanghera JS, Aggarwal ID (2000) Opt. Lett. 25:254