Capacitance-voltage profiling and the characterisation of III-V semiconductors using electrolyte barriers

10.1007/BF01119461

10.1007/BF00609022

10.1007/BF00608796

Ambridge T, 1975, 320

Ambridge T, 1980, J. Electrochem. Soc., 127, 222, 10.1149/1.2129623

Amron I, 1967, Electrochem. Technol., 5, 94

Baxandall P J, 1971, J. Phys. E: Sci. Instrum., 4, 213, 10.1088/0022-3735/4/3/014

Bleaney B I, 1976

Blood P, 1981, 251

10.1063/1.335948

Blood P, 1985, 427

Blood P, 1984, J. Appl. Phys., 56, 993, 10.1063/1.334040

Blood P, 1985

Blood P, 1978, Rep. Prog. Phys., 41, 157, 10.1088/0034-4885/41/2/001

10.1016/0749-6036(85)90009-6

Dingle R, 1975, vol 15, 21

Faktor M M, 1980, vol 6, 1

Faktor M M, 1978, J. Electrochem. Soc., 125, 621, 10.1149/1.2131512

Goodman A M, 1963, J. Appl. Phys., 34, 329, 10.1063/1.1702608

Johnson W C, 1971, IEEE Trans. Electron Devices, ED-18, 965, 10.1109/T-ED.1971.17311

Kennedy D P, 1969, IBM J. Res. Dev., 13, 212, 10.1147/rd.132.0212

10.1063/1.1663500

Klug H P, 1976, Exp. Tech. Phys., 23, 605

10.1016/0038-1101(81)90195-7

Kroemer H, 1980, Appl. Phys. Lett., 36, 295, 10.1063/1.91467

Miller A, 1986, Opt. Acta, 36

Miller G L, 1972, IEEE Trans. Electron Devices, ED-19, 1103, 10.1109/T-ED.1972.17557

10.1016/0038-1101(85)90003-6

Pankove J I, 1971

Redstall R M, 1978

Rhoderick E H, 1978

10.1007/BF00884233

Sharpe C D, 1980, J. Electrochem. Soc., 127, 1918, 10.1149/1.2130036

Sharpe C D, 1979, Electron. Lett., 15, 622, 10.1049/el:19790444

Stagg J P, 1982, J. Appl. Phys., 53, 3680, 10.1063/1.331153

Hovel H J, 1975, vol 11

10.1088/0305-4608/12/2/014

Sze S M, 1981

Wakefield B, 1979, Appl. Phys. Lett., 35, 347, 10.1063/1.91125

Whiteaway J E A, 1983, IEE Proc. 130, 165

Wiley J D, 1975, IEEE Trans. Electron Devices, ED-22, 265, 10.1109/T-ED.1975.18117

Wood C E C, 1979, 28

Woodbridge K, 1984, Appl. Phys. Lett., 45, 16, 10.1063/1.94986