Bit-errors as a source of forensic information in NAND-flash memory

Digital Investigation - Tập 20 - Trang S12-S19 - 2017
Jan Peter van Zandwijk1
1Netherlands Forensic Institute, Laan van Ypenburg 6, 2497 GB The Hague, The Netherlands

Tài liệu tham khảo

Breeuwsma, 2007, Forensic data recovery from flash memory, Small Scale Digit. Device Forensics, 1, 1 Cai, 2012, Error patterns in MLC NAND flash memory: measurement, characterization and analysis, Date, 521 Meza, J., Wu, Q., Kumar, S., Mutlu, O. A large-scale study of flash memory failures in the field. Proceedings of the ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems 2015, 177–190. Niset, 2005, Typical data retention for nonvolatile memory, Freescale Semicond. Eng. Bull., EB618/D Van Zandwijk, 2015, A mathematical approach to NAND flash-memory descrambling and decoding, Digit. Investig., 12, 41, 10.1016/j.diin.2015.01.003