Ứng dụng của phân tích bề mặt trong khoa học và công nghệ vật liệu

Springer Science and Business Media LLC - Tập 332 - Trang 421-432 - 2004
H. F. Fischmeister1
1Max-Planck-Institut für Metallforschung, Stuttgart, Federal Republic of Germany

Tóm tắt

Các phương pháp phân tích bề mặt như AES, ESCA, SIMS, RBS, ISS, GDOES và những phương pháp khác đã có sẵn cho các nhà nghiên cứu vật liệu trong khoảng hai thập kỷ qua. Trong nhiều trường hợp, thách thức trong nghiên cứu vật liệu đã kích thích những sáng tạo hoặc cải tiến trong các kỹ thuật phân tích, và ngược lại, các công cụ phân tích cải tiến đã khuyến khích các nhà khoa học vật liệu giải quyết những vấn đề mà trước đây có vẻ phức tạp một cách khó khăn. Bài báo này xem xét sự tương tác giữa các phát triển phân tích và tiến bộ trong việc hiểu và thao tác hành vi của vật liệu, sử dụng ví dụ từ các lĩnh vực công nghệ và khoa học khác nhau như phân tách lân cận hạt và sự giòn; chế tạo và đặc trưng hóa các thiết bị vi điện tử; sự bám dính và ma sát; tấm thép ô tô, và tiến bộ trong các kỹ thuật định lượng trong phân tích bề mặt.

Từ khóa

#phân tích bề mặt #khoa học vật liệu #công nghệ vật liệu #kỹ thuật phân tích #vật liệu nanostructure

Tài liệu tham khảo

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