Applications of electron holography

Reviews of Modern Physics - Tập 59 Số 3 - Trang 639-669
Akira Tonomura1
1Advanced Research Laboratory, Hitachi Ltd., Kokubunji, Tokyo 185, Japan

Tóm tắt

Từ khóa


Tài liệu tham khảo

Aharonov, Y., 1959, Phys. Rev., 115, 485, 10.1103/PhysRev.115.485

Baez, A. V., 1952, J. Opt. Soc. Am., 42, 756, 10.1364/JOSA.42.000756

Bocchieri, P., 1978, Nuovo Cimento A, 47, 47, 10.1007/BF02896237

Bocchieri, P., 1982, Lett. Nuovo Cimento, 35, 370, 10.1007/BF02754709

Boersch, H., 1940, Naturwissenschaften, 28, 711, 10.1007/BF01468513

Boersch, H., 1954, Z. Phys., 139, 115, 10.1007/BF01375256

Boersch, H., 1960, Z. Phys., 159, 397, 10.1007/BF01337540

Boersch, H., 1961, Z. Phys., 165, 79, 10.1007/BF01378089

Bonnet, M., 1978, Proceedings of the 9th International Congress in Electron Microscopy, Toronto

Bryngdahl, O., 1969, J. Opt. Soc. Am., 59, 142, 10.1364/JOSA.59.000142

Busch, H., 1926, Ann. Phys. (Leipzig), 81, 974, 10.1002/andp.19263862507

Cabrera, B., 1982, Phys. Rev. Lett., 48, 1378, 10.1103/PhysRevLett.48.1378

Chambers, R. G., 1960, Phys. Rev. Lett., 5, 3, 10.1103/PhysRevLett.5.3

Cohen, M. S., 1967, J. Appl. Phys., 38, 4966, 10.1063/1.1709262

Cox, H. L., Jr., 1967, J. Chem. Phys., 47, 2599, 10.1063/1.1712276

Crewe, A. V., 1968, Rev. Sci. Instrum., 39, 576, 10.1063/1.1683435

Crewe, A. V., 1970, Science, 168, 1338, 10.1126/science.168.3937.1338

DeVelis, J. B., 1966, J. Opt. Soc. Am., 56, 423, 10.1364/JOSA.56.000423

Ehrenberg, W., 1949, Proc. Phys. Soc. London, Sec. B, 62, 8, 10.1088/0370-1301/62/1/303

Endo, J., 1984, Proceedings of the 13th International Commission for Optics

Endo, J., 1979, Jpn. J. Appl. Phys., 18, 2291, 10.1143/JJAP.18.2291

Fowler, L. H., 1961, J. Appl. Phys., 32, 1153, 10.1063/1.1736175

Frabboni, S., 1985, Phys. Rev. Lett., 55, 2196, 10.1103/PhysRevLett.55.2196

Fukuhara, A., 1983, Phys. Rev. B, 27, 1839, 10.1103/PhysRevB.27.1839

Gabor, D., 1949, Proc. R. Soc. London, Ser. A, 197, 454, 10.1098/rspa.1949.0075

Gabor, D., 1951, Proc. Phys. Soc. London, Sec. B, 64, 449, 10.1088/0370-1301/64/6/301

Gingras, Y., 1980, Am. J. Phys., 48, 84, 10.1119/1.12272

Haine, M. E., 1950, Nature (London), 166, 315, 10.1038/166315a0

Haine, M. E., 1952, J. Opt. Soc. Am., 42, 763, 10.1364/JOSA.42.000763

Hanszen, K.-J., 1970, Optik, 32, 74

Hanszen, K.-J., 1982, Advances in Electronics and Electron Physics

Hibi, T., 1956, J. Electron Microsc., 4, 10

Jakubovics, J. P., 1964, Philos. Mag., 10, 675, 10.1080/14786436408228487

Kawasaki, T., 1986, J. Electron Microsc., 35, 211

Kirkpatrick, P., 1956, J. Opt. Soc. Am., 46, 825, 10.1364/JOSA.46.000825

Klein, A. G., 1983, Rep. Prog. Phys., 46, 259, 10.1088/0034-4885/46/3/001

Konopinski, K. J., 1978, Am. J. Phys., 46, 499, 10.1119/1.11298

Krimmel, E., 1960, Z. Phys., 158, 35, 10.1007/BF01325788

Kulyupin, Yu A., 1978, Optik, 52, 101

Lauer, R., 1984, Optik, 67, 159

Leith, E. N., 1962, J. Opt. Soc. Am., 52, 1123, 10.1364/JOSA.52.001123

Lenz, F., 1984, Optik, 67, 315

Lichte, H., 1982, Proceedings of the 10th International Congress on Electron Microscopy, Hamburg

Lichte, H., 1985, Optik, 70, 176

Lichte, H., 1986, Ultramicroscopy, 20, 293, 10.1016/0304-3991(86)90193-2

Lischke, B., 1969, Phys. Rev. Lett., 22, 1366, 10.1103/PhysRevLett.22.1366

Marton, L., 1952, Phys. Rev., 85, 1057, 10.1103/PhysRev.85.1057

Matsuda, K., 1981, Appl. Opt., 20, 2763, 10.1364/AO.20.002763

Matsuda, T., 1982, J. Appl. Phys., 53, 5444, 10.1063/1.331475

Matsumoto, K., 1970, J. Opt. Soc. Am., 60, 30, 10.1364/JOSA.60.000030

Matteucci, G., 1982, Ultramicroscopy, 8, 403, 10.1016/0304-3991(82)90063-8

McFadyen, I. R., 1985, Proceedings of the 11th International Colloquium on Magnetic Films and Surfaces, Asilomar State Park, California

Meier, R., 1965, J. Opt. Soc. Am., 55, 987, 10.1364/JOSA.55.1693_1

Merli, P. G., 1974, J. Microsc. (Paris), 21, 11

Missiroli, G. F., 1981, J. Phys. E, 14, 649, 10.1088/0022-3735/14/6/001

Mitsuishi, T., 1951, Proc. Jpn. Acad., 27, 86, 10.2183/pjab1945.27.86

Möllenstedt, G., 1962, Phys. B1., 18, 299

Möllenstedt, G., 1955, Naturwissenschaften, 42, 41, 10.1007/BF00621530

Möllenstedt, G., 1982, Proceedings of the 10th International Congress on Electron Microscopy

Möllenstedt, G., 1968, Naturwissenschaften, 55, 340, 10.1007/BF00600454

Müller, E. W., 1937, Z. Phys., 106, 541, 10.1007/BF01339895

Munch, J., 1975, Optik, 43, 79

Osakabe, N., 1986, Phys. Rev. A, 34, 815, 10.1103/PhysRevA.34.815

Osakabe, N., 1983, Appl. Phys. Lett., 42, 746, 10.1063/1.94048

Pozzi, G., 1973, J. Microsc. (Paris), 18, 103

Rogers, G. L., 1951, Proc. R. Soc. Edinburgh, Sect. A, 63, 193

Rogers, J., 1980, Advances in Optical and Electron Microscopy

Roy, S. M., 1980, Phys. Rev. Lett., 44, 111, 10.1103/PhysRevLett.44.111

Saxon, G., 1972, Optik, 35, 195

Silverman, 1986, Phys. Lett. A, 118, 155, 10.1016/0375-9601(86)90502-5

Sunagawa, I., 1961, Am. Mineral., 46, 1216

Tomita, T., 1970, Jpn. J. Appl. Phys., 9, 719, 10.1143/JJAP.9.719

Tomita, T., 1972, Jpn. J. Appl. Phys., 11, 143, 10.1143/JJAP.11.143

Tonomura, A., 1969, J. Electron Microsc., 18, 77

Tonomura, A., 1972, Jpn. J. Appl. Phys., 11, 493, 10.1143/JJAP.11.493

Tonomura, A., 1968, Jpn. J. Appl. Phys., 7, 295, 10.1143/JJAP.7.295

Tonomura, A., 1980, Jpn. J. Appl. Phys., 19, 97, 10.1143/JJAP.19.L97

Tonomura, A., 1979, Jpn. J. Appl. Phys., 18, 9, 10.1143/JJAP.18.9

Tonomura, A., 1980, Phys. Rev. Lett., 44, 1430, 10.1103/PhysRevLett.44.1430

Tonomura, A., 1986, Phys. Rev. B, 34, 3397, 10.1103/PhysRevB.34.3397

Tonomura, A., 1979, J. Electron Microsc., 28, 1

Tonomura, A., 1985, Phys. Rev. Lett., 54, 60, 10.1103/PhysRevLett.54.60

Tonomura, A., 1982, Phys. Rev. Lett., 48, 1443, 10.1103/PhysRevLett.48.1443

Tonomura, A., 1982, Phys. Rev. B, 25, 6799, 10.1103/PhysRevB.25.6799

Tonomura, A., 1986, Phys. Rev. Lett., 56, 792, 10.1103/PhysRevLett.56.792

Tonomura, A., 1984, Proceedings of International Symposium on Foundations of Quantum Mechanics, 1983

Wade, R. H., 1980, Computer Processing of Electron Microscope Images

Wahl, H., 1970, Optik, 30, 508

Wahl, H., 1979, Optik, 54, 27

Walker, I. R., 1986, Phys. Rev. B, 33, 5028, 10.1103/PhysRevB.33.5028

Weingärtner, I., 1969, Optik, 30, 318

Wohlleben, D., 1966, Phys. Lett., 22, 564, 10.1016/0031-9163(66)90655-X

Worster, J., 1969, J. Phys. D, 2, 457, 10.1088/0022-3727/2/3/321

Wu, T. T., 1975, Phys. Rev. D, 12, 3845

Yoshida, K., 1983, IEEE Trans. Mag., MAG-19, 1600, 10.1109/TMAG.1983.1062674

Zeitler, E., 1979, Proceedings of the 37th Electron Microscopy Society of America Meeting