Applications of TGA in quality control of SWCNTs

Springer Science and Business Media LLC - Tập 396 - Trang 1071-1077 - 2009
Elisabeth Mansfield1, Aparna Kar1, Stephanie A. Hooker1
1Materials Reliability Division, National Institute of Standards and Technology (NIST), Boulder, USA

Tóm tắt

Carbon nanotubes exhibit a range of chemistries, including mixtures of different nanotube diameters, lengths, and chiralities coupled with various concentrations of metallic and non-nanotube-carbon impurities. The performance of a given material for a specific application depends on the chemistry, which is dictated in large part by the manufacturing process. Here, thermogravimetric analysis is utilized as a bulk characterization method for determining nanotube quality after manufacturing. The application of thermogravimetric analysis for quantifying basic nanotube chemistry is described (e.g., carbon-to-metal content, homogeneity). In addition, extension of the method to analyze specific nanotube properties (i.e., length and diameter) is reported. Results indicate that thermogravimetric analysis is sufficiently sensitive to enable quality control at both the macro-scale (carbon-to-metal ratio) and nano-scale (single-walled to multi-walled) and can detect subtle modifications in manufacturing processes.

Tài liệu tham khảo

Baughman RH, Zakhidov AA, de Heer WA (2002) Science 297:787–792 de Heer WA (2004) MRS Bulletin 281-285 Jorio A, Dresselhaus G, Dresselhaus MS (2008) Carbon nanotubes: advanced topics in the synthesis, structure, properties and applications. Springer, Heidelberg Freiman S, Hooker S, Migler K, Arepali S (2008) Measurement issues in single wall carbon nanotubes, special publication 960-19 ed Fagan JA, Becker ML, Chun J, Nie P, Bauer BJ, Simpson JR, Hight Walker AR, Hobbie EK (2008) Langmuir 24:13880–13889 Fagan JA, Becker ML, Chun J, Hobbie EK (2008) Adv Mater 20:1609–1613 Trigueiro JPC, Silva GG, Lavall RL, Furtado CA, Oliveira S, Ferlauto AS, Lacerda RG, Ladeira LO, Liu J-W, Frost RL, George GA (2007) J Nanosci Nanotech 7:3477–3486 Murakami Y, Miyauchi Y, Chiashi S, Maruyama S (2003) Chem Phys Lett 374:53–58 Dillon AC, Gennett T, Jones KM, Alleman JL, Parilla PA, Heben MJ (1999) Adv Mater 11:1354–1358 Nikolaev P (2004) J Nanosci Nanotech 4:307–316 Lolli G, Zhang L, Balzano L, Sakulchaicharoen N, Tan Y, Resasco DE (2006) J Phys Chem B 110:2108–2115 Zhou W, Xie S, Sun L, Tang D, Li Y, Liu Z, Ci L, Zou X, Wang G, Tan P, Dong X, Xu B, Zhao B (2002) Appl Phys Lett 80:2553–2555