An efficient test vector compression scheme using selective huffman coding

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems - Tập 22 Số 6 - Trang 797-806 - 2003
Abhijit Jas1, J. Ghosh-Dastidar2, Mom-Eng Ng3, Nur A. Touba4
1Intel Corporation, Austin, TX, USA
2Altera Corporation, San Jose, CA, USA
3Advanced Micro Devices, Inc., Austin, TX, USA
4Computer Engineering Research Center, Department of Electrical and Computer Engineering, University of Technology, Austin, TX, USA

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Tài liệu tham khảo

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IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Tập 22 Số 6

797-806

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