An efficient similarity measure approach for PCB surface defect detection
Tóm tắt
Từ khóa
Tài liệu tham khảo
Bai X, Fang Y, Lin W, Wang L, Ju BF (2014) Saliency-based defect detection in industrial images by using phase spectrum. IEEE Trans Ind Inform 10:2135–2145
Jian C, Gao J, Ao Y (2017) Automatic surface defect detection for mobile phone screen glass based on machine vision. Appl Soft Comput 52:348–358
Cheng H, Liu Z, Hou L, Yang J (2016) Sparsity-induced similarity measure and its applications. IEEE Trans Circuits Syst Video Technol 26:613–626
Dong Y, Du B, Zhang L, Zhang L (2017) dimensionality reduction and classification of hyperspectral images using ensemble discriminative local metric learning. IEEE Trans Geosci Remote Sens 55:2509–2524
Gaidhane VH, Hote YV, Singh V (2016) Emotion recognition using eigenvalues and Levenberg–Marquardt algorithm-based classifier. Sadhana 41:415–423
Gaidhane VH, Hote YV, Singh V (2014) An efficient approach for face recognition based on common eigenvalues. Pattern Recognit 47:1869–1879
Costa CE, Petrou M (2000) Automatic registration of ceramic tiles for the purpose of fault detection. Mach Vis Appl 11:225–230
Son S, So H, Kim J, Choi D, Lee HJ (2015) Energy-efficient adaptive optical character recognition for wearable devices. Electron Lett 52:113–115
Sun TH, Liu CS, Tien FC (2008) Invariant 2D object recognition using eigenvalues of covariance matrices, re-sampling and autocorrelation. Expert Syst Appl 35:1966–1977
Wei SD, Lai SH (2008) Fast template matching based on normalized cross correlation with adaptive multilevel winner update. IEEE Trans Image Process 17:2227–2235
Zhang Z, Deriche R, Faugeras O, Luong QT (1995) A robust technique for matching two uncalibrated images through the recovery of the unknown epipolar geometry. Artif Intell 78:87–119
Tsai DM, Yang RH (2005) An eigenvalue-based similarity measure and its application in defect detection. Image Vis Comput 23:1094–1101
Li M, Yuan B (2005) 2D-LDA: a statistical linear discriminant analysis for image matrix. Pattern Recognit Lett 26:527–532
Debella-Gilo M, Kaab A (2011) Sub-pixel precision image matching for measuring surface displacements on mass movements using normalized cross-correlation. Remote Sens Environ 115:130–142
Weinberger KQ, Saul LK (2009) Distance metric learning for large margin nearest neighbor classification. J Mach Learn Res 10:207–244
Ying Y, Huang K, Campbell C (2009) Sparse metric learning via smooth optimization. In: Advances in neural information processing systems, pp 2214–2222
Xu C, Tao D, Xu C, Rui Y (2014) Large-margin weakly supervised dimensionality reduction. In: Proceedings of the 31st international conference on machine learning (ICML-14), pp 865–873
Ercal F, Allen M, Feng H (2000) A systolic difference algorithm for RLE-compressed images. IEEE Trans Parallel Distrib Syst 11:433–443
Ibrahim Z,. Al-Attas SAR, Aspar Z (2002) Analysis of the wavelet-based image difference algorithm for PCB inspection. In: Proceedings of the 41st SICE annual conference, pp 2108–2113
Moganti M, Ercal F, Dagli CH, Tsunekawa S (2011) Automatic PCB inspection algorithms: a survey. Comput Vis Image Underst 63:287–313
Kumar A (2008) Computer-vision-based fabric defect detection: a survey. IEEE Trans Ind Electron 55:348–363
Tsai DT, Lin CT (2003) Fast normalized cross correlation for defect detection. Pattern Recognit Lett 24:2625–2631
Tsai DM, Lin CT, Chen JF (2003) The evaluation of normalized cross correlations for defect detection. Pattern Recognit Lett 24:2525–2535
Tsai DM, Chiyang IY, Tsai YH (2012) A shift-tolerant dissimilarity measure for surface defect detection. IEEE Trans Ind Inf 8:128–137
Chen X, Liu N, Bo Y, Bo Xiao (2016) A novel method for surface defect inspection of optic cable with short-wave infrared illuminance. Infrared Phys Technol 77:456–463
Datta K (1982) An algorithm to determine if two matrices have common eigenvalues. IEEE Trans Autom Control 27:1131–1133
Gaidhane VH, Hote YV, Singh V (2015) Image focus measure based on polynomial coefficients and spectral radius. Signal Image Video Process 9:203–211
Luan H, Qi F, Xue Z, Chen L, Shen D (2008) Multimodality image registration by maximization of quantitative–qualitative measure of mutual information. Pattern Recognit 41:285–298