Một cách tiếp cận để dự đoán tổn thất công suất động của mạng kết nối liên kết bị ghép trong mạch logic CMOS động
Tóm tắt
Từ khóa
Tài liệu tham khảo
Freund, R. W., Feldmann, P., The SyMPVL algorithm and its applications to interconnect simulation, in Numer. Anal. Manuscript, Murray Hill, NJ: Bell Labs., June 1997.
Odabasioglu, A., Celik, M., Pileggi, L. T., PRIMA: Passive reducedorder interconnect macromodeling algorithm, IEEE Trans. Computer- Aided Design, Aug. 1998, 17: 645–654.
Cai Xia, Yang Huazhong, Jia Yaowei et al., RSPICE: a fast and robust timing simulator for digital MOS VLSI, IEICE Trans. Fundamentals, Nov. 1999, E82-A(11): 2492–2498.
Yang Huazhong, Cai Xia, Jia Yaowei, MOS transistor model and fast timing simulator, Electronics Letters, April, 1999, 35(7): 561–563.
Kayssi, A. I., Sakallah, K. A., Mudge, T. N., The impact of signal transition time on path delay computation, IEEE Transaction on Circuit and System-II: Analog and Digital Signal Processing, May 1993, 40(5): 302–309.
Franzini, B., Forzan, C., Pandini, D. et al., Crosstalk aware static timing analysis: A two step approach, Proc. IEEE Int. Sym. Quality Electr. Design, San Jose, CA, March 2000, 499–503.
Gao, D. S., Yang, A. T., Kang, S., Modelling and simulation of interconnection delays and crosstalk in high-speed intergrated circuits, IEEE Trans. Circuits Syst., Jan. 1990, SC-37(1): 1–9.
Chen Bin, Yang Huazhong, Wang Hui, Noise estimation of deep sub-micron integrated circuits, Science in China, Ser. F, 2001, 44(5): 396–400.
Chen, P., Keutzer, K., Towards true crosstalk noise analysis, IEEE/ACM Int. Conf. Comp-Aided Design, San Jose, CA, Nov.1999, 132–137.
Ercolani, S., Favalli, M., Damiani, M. et al., Estimate of signal probability in combinational logic networks, 1989 IEEE European Test Conf., Paris, April, 1989, 132–138.
Najm, F., A survey of power estimation in VLSI circuits, IEEE Tran. On VLSI Systems, Nov. 1994, 2(4): 446–455.
Pedram, M., Power simulation and estimation in VLSI circuits, in The VLSI Handbook (ed. Chen, W.-K.), Boca Raton: CRC Press and New York: IEEE Press, 1999, 18-1–18-23.
Najm, F., Transition density, a new measure of activity in digital circuit, IEEE Trans. Computer-Aided Design, Feb. 1993. 12: 310–323.