An Improved SDA Based Defect Prediction Framework for Both Within-Project and Cross-Project Class-Imbalance Problems

10.1037/0033-2909.114.3.494

10.1145/2786805.2786813

10.1109/ICSE.2015.139

yang, 2015, Deep learning for just-in-time defect prediction, Proc Int Conf Softw Quality Rel Secur, 17

he, 2005, Laplacian score for feature selection, Proc Adv Neural Inf Process Syst, 507

hart, 2001, Pattern Classification

10.1016/j.jss.2007.07.040

10.1109/ICSE.2013.6606584

boetticher, 2007, The PROMISE repository of empirical software engineering data

10.1016/j.infsof.2011.09.007

10.1016/j.ins.2014.03.043

10.1145/1595696.1595713

10.1109/TSMCC.2012.2226152

10.1145/2568225.2568320

10.1002/widm.38

10.1109/CSMR-WCRE.2014.6747166

10.1109/ICST.2013.38

10.1109/ESEM.2013.20

10.1007/s10515-011-0090-3

kotsiantis, 2006, Data preprocessing for supervised learning, Int J Comput Sci, 1, 111

10.1016/j.ins.2013.04.016

10.1162/jocn.1991.3.1.71

10.1155/2014/785435

10.1016/j.eswa.2009.12.056

10.1016/S0031-3203(96)00142-2

10.1109/TSMCA.2009.2027131

10.1080/01621459.1961.10482090

demsar, 2006, Statistical comparisons of classifiers over multiple data sets, J Mach Learn Res, 7, 1

10.1109/ICSMC.2011.6084055

10.1016/j.fss.2007.12.023

10.1109/TSE.2012.70

10.1007/s10664-015-9400-x

10.1109/TSE.2011.103

10.1109/TSE.2007.256941

10.1145/1368088.1368161

wang, 0, Naïve Bayes software defect prediction model, Proc Int Conf Comput Intell Softw Eng, 1

10.1016/j.datak.2008.10.005

10.1109/TR.2014.2316951

10.1109/TR.2012.2183912

10.1145/1370788.1370801

10.1109/TR.2013.2259203

10.1109/ESEM.2009.5316002

10.1109/TSE.2012.83

10.1109/IJCNN.2010.5596702

chawla, 2002, SMOTE: Synthetic minority over-sampling technique, J Artif Intell Res, 16, 321, 10.1613/jair.953

10.1007/s10664-014-9300-5

duan, 0, Domain transfer SVM for video concept detection, Proc 26th IEEE Int Conf Comput Vis Pattern Recogn, 1375

10.1145/1772690.1772767

dai, 0, Transferring naive Bayes classifiers for text classification, Proc 22th Natl Conf Artif Intell, 540

10.1145/2597073.2597075

10.1145/2597073.2597078

10.1109/ISSRE.2008.54

10.1109/MS.2013.86

10.1007/s10664-014-9346-4

10.1145/2491411.2501854

10.1109/TSE.2014.2322358

10.1007/978-3-642-03969-0_21

10.1007/978-3-642-13318-3_3

gayatri, 0, Feature selection using decision tree induction in class level metrics dataset for software defect predictions, World Congress on Engineering and Computer Science, 124

10.1109/QSIC.2012.19

10.1016/j.jss.2004.05.001

10.1142/S0218194012400116

10.1145/2568225.2568269

rahman, 0, Sample size versus bias in defect prediction, Proc 9th Joint Meeting Found Softw Eng, 147

10.1145/2568225.2568228

10.1145/2568225.2568271

10.1109/ICSE.2015.91

10.1109/TR.2014.2370891

10.1007/s10664-008-9103-7

10.1007/s10664-008-9079-3

10.1109/ICSE.2015.92

10.1145/2025113.2025120

watanabe, 0, Adapting a fault prediction model to allow inter language reuse, Proc Third Int'l Workshop Predictor Models Software Eng, 19

10.1109/TSE.2002.1019484

zhu, 2006, Subclass discriminant analysis, IEEE Trans Pattern Anal Mach Intell, 28, 1274, 10.1109/TPAMI.2006.172

10.1007/s10664-011-9173-9

10.1109/TSE.2013.11

10.1109/TNN.2010.2091281