An AF-1 Analytical Fourier-Transform Spectrometer for a Wide Field of Applications

Springer Science and Business Media LLC - Tập 46 - Trang 219-221 - 2003
A. A. Balashov1, V. A. Vagin1, A. V. Viskovatykh1, G. N. Zhizhin1, V. I. Pustovoit1, A. I. Khorokhorin1
1Scientific and Technological Center for Unique Instrumentation, Russian Academy of Sciences, Moscow, Russia

Tóm tắt

An AF-1 Fourier spectrometer is developed on the basis of a two-beam interferometer with a pendulum-type scanning unit, which is manufactured of a special alloy ensuring its time stability, and a stationary block of plane reflectors made of a highly stable glass. The performance characteristics of the instrument are as follows: the IR spectrum region is 400–4000 cm–1; the highest resolution is 1 cm–1; the accuracy of determining wave numbers is ±0.1 cm–1; the optical-density measurement range is 0.05–3 units; the variations of the deviation from the 100% transmission level in the entire spectral region are within ±0.5%; the rms deviation of the optical density in the range of 0.2–2.0 units is ∼1%; and the signal-to-noise ratio in the range of 2000–2100 cm–1 is at least 104 for a measurement time of 2 min and a spectral resolution of 1 cm–1.

Tài liệu tham khảo

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