AFM analysis of wobble amplitude

D.L. Burkhead1, D.A. Chernoff1
1Advanced Surface Microscopy, Inc., Indianapolis, IN, USA

Tóm tắt

We directly measure track wobble amplitude in recordable optical disc media using AFM images and automated analysis procedures. Wobble amplitude of 30 nm is easily measured, but calibration is important in order to avoid errors.

Từ khóa

#Size measurement #Image analysis #Optical microscopy #Spirals #Atomic force microscopy #Optical recording #Calibration #Manufacturing #Timing #Trajectory

Tài liệu tham khảo

0, DVD+RW image courtesy of Paul van Roosmalen and Elise Rodenburg donald, 1999, Automated, high precision measurement of critical dimensions using the Atomic Force Microscope, J Vac Sci Technol, a 17