A reduction approach to improve the quantification of linked fault trees through binary decision diagrams

Reliability Engineering & System Safety - Tập 95 - Trang 1314-1323 - 2010
Cristina Ibáñez-Llano1, Antoine Rauzy2, Enrique Meléndez3, Francisco Nieto1
1Instituto de Investigación Tecnológica (IIT), Escuela Técnica Superior de Ingeniería ICAI, Universidad Pontificia Comillas, C/Santa Cruz de Marcenado 26, 28015 Madrid, Spain
2Dassault Systèmes, 10 rue Marcel Dassault CS 40501, 78946 Velizy Villacoublay, Cedex, France
3Consejo de Seguridad Nuclear (CSN), C/Justo Dorado 11, 28040 Madrid, Spain

Tài liệu tham khảo

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