A new mobile grazing-incidence X-ray absorption fine spectroscopy endstation at Beijing Synchrotron Radiation Facility
Tóm tắt
A new mobile grazing-incidence X-ray absorption fine spectroscopy (GIXAFS) endstation was developed at Beijing Synchrotron Radiation Facility (BSRF) to improve the function of general XAFS beamlines and extend their capabilities to a wider user community. We developed a facile GIXAFS endstation through modifying the regular XAFS in grazing-incidence geometry. Additionally, a soller slit, filter, photographic film and tiny lead sheets were assembled to improve the signal-to-noise ratio of XAFS data. Furtherly, combined with time-resolved quick scanning XAFS (QXAFS) techniques, the systems can perform in situ XAFS measurement to study materials under operando condition. The GIXAFS had been used to collect the Ga K-edge XAFS of InGaN thin film on sapphire substrate, which demonstrated that signal-to-noise ratio of XAFS data had been greatly improved through suppressing the effect of substrate diffractions. Moreover, the feasibility of GIXAFS-QXAFS combination was illustrated with in situ exploring the degradation of organic–inorganic perovskites under X-ray radiation. A new mobile and facile GIXAFS endstation has been developed for thin films study. Based on the photographic film and lead sheets, the contamination of the XAFS from the matrix is minimized. Further combined with QXAFS techniques, the systems are used to reveal the X-ray-induced organic–inorganic perovskite thin films photodegrading process, which proved their successful application in the time-resolved measurements, extending the capabilities of general beamlines available to a wider user community.
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