A new microtomographic technique for non‐invasive evaluation of the bone structure around implants

Clinical Oral Implants Research - Tập 12 Số 1 - Trang 91-94 - 2001
Lars Sennerby1, Ann Wennerberg2, Freek Pasop3
1Dept of Biomaterials/Handicap Research, Institute for Surgical Sciences, Göteborg University, Brånemark Clinic, Public Dental Health Service, Göteborg City, Sweden.
2Dept of Biomaterials/Handicap Research, Institute for Surgical Sciences, Dept of Prosthetic Dentistry, Faculty of Odontology, Göteborg University, Sweden
3ThIS Scientific, Sliedrecht, The Netherlands

Tóm tắt

Abstract: A new X‐ray microtomographic technique for non‐invasive assessment of the structure of bone surrounding implants was tested. Three titanium microimplants retrieved directly (n=2) or 6 months (n=1) after insertion in 3 patients were used as test samples. Two samples were used dry and one was embedded in plastic resin prior to microtomography. The technique provided high‐resolution consecutive cross‐sectional X‐ray images of the specimens with a slice‐to‐slice distance of 4.4 to 11.0 μm. The pictures could be imported into an image analysing software with which semiautomatic quantitative measurement of the bone area and three‐dimensional images of the specimens could be made. It is suggested that the technique may be used for non‐invasive assessment of the bone structure around implants. Further studies are needed to evaluate the accuracy of the technique, for instance by comparing tomographic sections with histologic ones.

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