A model for scattering due to interface roughness in finite quantum wells

Semiconductor Science and Technology - Tập 20 Số 12 - Trang 1207-1212 - 2005
J M Li1, Jun-Bao Wu1, Xiuxun Han1, Yanwu Lü2, X L Liu1, Qin‐Feng Zhu1, Z G Wang1
1Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, People’s Republic of China
2Department of Physics, Beijing Jiaotong University, Beijing 100044, People's Republic of China

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