A Polynomial Kernel Induced Distance Metric to Improve Deep Transfer Learning for Fault Diagnosis of Machines

IEEE Transactions on Industrial Electronics - Tập 67 Số 11 - Trang 9747-9757 - 2020
Bin Yang1, Yaguo Lei1, Feng Jia1, Naipeng Li1, Zhaojun Du1
1Key Laboratory of Education Ministry for Modern Design and Rotor-bearing System, Xi’an Jiaotong University, Xi’an, China

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