A Fourier transform Raman spectroscopic study of the structures of polyethylene composite films containing GaAs and GaAs〈Te〉
Tóm tắt
The structuring of initial and composite films based on the high-density polyethylene-containing semiconductor fillers GaAs and GaAs〈Te〉 is studied at room temperature via Fourier transform Raman spectroscopy. On the basis of changes in the intensities of Raman lines of skeletal and bending vibrations, strengthening of the crystalline structure of the composite films is investigated. The diffractograms of the samples are obtained, and their degrees of crystallinity are determined. It is shown that, depending on the type and concentration of the filler, the degrees of crystallinity of the composite films increase by a factor of 1.3–1.5 relative to that of the initial polyethylene. The results are explained within the three-phase model by changes in the supramolecular structure of the semicrystalline polymer.
Tài liệu tham khảo
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