Dielectric relaxation in glassy Se80−xTe20Gex

Journal of Materials Science - Tập 35 - Trang 1017-1021 - 2000
D. K. Goel1, C. P. Singh1, R. K. Shukla2, A. Kumar2
1Department of Physics, V.S.S.D. College, Kanpur, India
2Department of Physics, H.B.T.I., Kanpur, India

Tóm tắt

Dielectric relaxation studies have been made in glassy Se80−xTe20Gex alloys where 0 ≤ x ≤ 20. The measurements of dielectric constant (∈′) and dielectric loss (∈″) are made in the audio frequency range (1 kHz to 10 kHz) at various temperatures from 30°C to 150°C. The results indicate that the dielectric dispersion occurs in the above frequency and temperature range. An analysis of the results shows that the dielectric losses are dipolar in nature and can be understood in terms of hopping of charge carriers over a potential barrier.

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Journal of Materials Science

Tập 35

1017-1021

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