Integrating Burr type testing effort functions in logistic reliability growth model with uncertainty factor
Tóm tắt
Software reliability growth models are modelled using a string of parameters and a set of assumptions. The fact that most of these models don’t typically take into consideration the uncertainty in the assumptions and parameters is a significant issue. Therefore, sometimes, the expected reliability in testing phase drastically varies in real operational phase. The existing logistic growth model under consideration in this study has a built-in explicit uncertainty factor covering for the effects of any uncertainties. In this paper, additionally, Burr type X and Burr type XII testing effort functions are integrated into the Logistic growth model to obtain new models having both Testing Effort Functions and uncertainty factors. By validating the proposed models on two real-world datasets, the applicability of the two proposed models is demonstrated. In terms of six comparison criteria, comparisons with some well-established models are foregrounded.
Tài liệu tham khảo
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