Measurement optimum condition of speckle interferometry based on dual-camera technique

Sirohi, 1993 Cloud, 1995 Thompson, 1996 Jones, 1981, General parameters for the design and optimization of electronic speckle pattern interferometers, Opt. Acta, 28, 949, 10.1080/713820641 Macovski, 1971, Time-lapse interferometry and contouring using television system, Appl. Opt., 10, 2722, 10.1364/AO.10.002722 Sjodahl, 1997, Accuracy in electronic speckle photography, Appl. Opt., 36, 2875, 10.1364/AO.36.002875 Kato, 1993, Automatic deformation analysis by a TV speckle interferometer using a laser diode, Appl. Opt., 32, 77, 10.1364/AO.32.000077 Meinlschmit, 1996 Creath, 1985, Phase-shifting speckle interferometry, Appl. Opt., 24, 3053, 10.1364/AO.24.003053 Robinson, 1986, Digital phase stepping speckle interferometry, Opt. Commun., 57, 26, 10.1016/0030-4018(86)90200-2 Nakadate, 1985, Fringe scanning speckle-pattern interferometry, Appl. Opt., 24, 2172, 10.1364/AO.24.002172 Arai, 2004, In-plane displacement measurement using electronic speckle pattern interferometry based on spatial fringe analysis method, Opt. Eng., 43, 2168, 10.1117/1.1778731 Arai, 2001, Improvement of measuring accuracy of spatial fringe analysis method using a Kalman filter and its application, Opt. Eng., 40, 2605, 10.1117/1.1410103 M. Kujawinska, Spatial techniques of automatic fringe pattern analysis, in: SPIE, 1991 International Symposium on Optical Applied Science and Engineering, Short Couse-77 Textbook (SPIE, 1991), pp. 2–16. Arai, 2008, Electronic speckle pattern interferometry based on spatial fringe analysis method using two cameras, J. Mod. Opt., 55, 281, 10.1080/09500340701433167 Arai, 2008, High-resolution dynamic measurement using electronic speckle pattern interferometry based on multi-camera technology, Opt. Lasers Eng., 46, 733, 10.1016/j.optlaseng.2008.05.014 Kwon, 1984, Multichannel phase-shifted interferometer, Opt. Lett., 9, 59, 10.1364/OL.9.000059 P. Meinlschmit, D.K. Hinsch, S.R. Sirohi, J.B. Thompson, Selected Papers on Electronic Speckle Pattern Interferometry Principles and Practice, SPIE Milestone Series, vol. MS 132, SPIE Optical Engineering Press, Bellingham, 1996. Gasvik, 1995 Smythe, 1984, Instantaneous phase measuring interferometry, Opt. Eng., 23, 361, 10.1117/12.7973301 Mertz, 1983, Complex interferometry, Appl. Opt., 22, 1530, 10.1364/AO.22.001530 Haasteren, 1994, Real-time displacement measurement using a multicamera phase-stepping speckle interferometer, Appl. Opt., 33, 4137, 10.1364/AO.33.004137 Malacara, 1992 Lee, 2004, Application of electronic speckle-pattern interferometry to measure in-plane thermal displacement in flip-chip packages, Mater. Sci. Eng. A, 380, 231, 10.1016/j.msea.2004.03.068 Dilhaire, 1999, Optical method for the measurement of the thermomechanical behavior of electronic devices, Microelectron. Reliab., 39, 981, 10.1016/S0026-2714(99)00134-1 Nassim, 1999, High-resolution interferometry and electronic speckle pattern interferometry applied to the thermomechanical study of a MOS power transistor, Microelectron. J., 30, 1125, 10.1016/S0026-2692(99)00074-9