Fine-grained polysilicon films with built-in tensile strain

IEEE Transactions on Electron Devices - Tập 35 Số 6 - Trang 800-801 - 1988
H. Guckel1, D.W. Burns1, C.C.G. Visser1, H.A.C. Tilmans1, D. Deroo1
1Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA

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Tài liệu tham khảo

guckel, 1987, Measurement and control of micro mechanical properties of thin films, Int Workshop Phys Semicond Devices

10.1016/0250-6874(86)80032-4

10.1063/1.334435

guckel, 1987, Fine grained polysilicon and its application to planar pressure transducers, Transducers 87

10.1149/1.2119965

guckel, 1984, planar processed polysilicon sealed cavities for pressure transducer arrays, 1984 International Electron Devices Meeting, 223, 10.1109/IEDM.1984.190686