Electrochemistry of Tin in Borate Buffer Solutions: An in-situ Raman study.

Springer Science and Business Media LLC - Tập 781 - Trang 131-136 - 2004
Raül Díaz1, Ismael Díez-Pérez1, Pau Grostiza1, Fausto Sanz1, Susanne Joiret2, Philippe Allongue2
1LCTEM, Department of Physical Chemistry, University of Barcelona, Martí i Franquès 1, Barcelona, Spain
2UPR 15 du CNRS, conventionné avec l'Université Paris, Paris, France

Tóm tắt

The electrochemical behavior of chemically polished polycrystalline tin is investigated in borate buffer solutions at pH=7.5 using in-situ Raman measurements. Experiments reveal the appearance of “luminescence” under continuum red laser light only for a narrow range of sample potentials within the anodic plateau. The phenomenon is discussed in view of the tin oxides formed on the surface, and correlated with the assignation of the oxido-reduction processes observed in the voltammograms.

Tài liệu tham khảo

L. Young, in Anodic Oxide Films; (Academic Press, New York, 1961). A.K. Vijh, Anodic Oxide Films: Influence of Solid State Properties on Electrochemical Behavior of Oxides and Oxide Films, edited by J.W. Diggle (Marcel Dekker, New York, 1973), vol. 2. M. Pourbaix, in Atlas of Electrochemical Equilibria in Aqueous Solutions (Pergamon Press, Oxford, 1966). S.N. Shah, D.E. Davies, Electrochimica Acta 8, 703 (1963); M.L. Varsanyi, J. Jaen, A. Vertes, L. Kiss, ibid., 30, 529 (1985); M. Metikos-Hukovic, A. Resetic, V. Gvozdic, ibid., 40, 1777 (1995) 1995, 40, 1777. B.N. Stirrup, N.A. Hampson, J. Electroanal. Chem. 67, 45 (1976). S. Kapusta, N. Hackerman, Electrochimica Acta 25, 949 (1980); 25, 1001 (1980); 25, 1625 (1980); J. Electrochem. Soc. 128 (2), 327 (1981); 129 (9), 1886 (1982). R. Díaz, J. Arbiol, A. Cirera, F. Sanz, F. Peiró, A. Cornet, J.R. Morante, Chem. Mater. 13, 4362 (2001); R. Díaz, J. Arbiol, F. Sanz, A. Cornet, J.R. Morante, ibid., 14, 3277 (2002). I. Díez-Pérez, P. Gorostiza, F. Sanz, C. Müller, J. Electrochem. Soc. 148 (8), B307 (2001); in Proceedings of the Symposium “Scanning Probe Microscopy for Electrode Characterization and Nanometer Scale Modification”, (The Electrochemical Society Inc., Pennington NJ, 2001), vol. 2000–35, p. 122. B.X. Huang, P. Tornatore, Y.-S. Li, Electrochimica Acta, 46, 671 (2000). T. Hirokawa, K. Yomogita, K. Honda, Jap. J. App. Phys., 9 (10), 1210 (1970). R. Díaz, I. Díez-Pérez, P. Gorostiza, F. Sanz, J.R. Morante, submitted to J. Bras. Chem. Soc. T.M. Herne, R.L. Garrell, Anal. Chem. 63, 2290 (1991). Technology of III-V, II-VI and Non-Tetrahedrally Bonded Compounds, Landolt-Börnstein New Series, edited by M. Schulz and H. Weiss (Springer-Verlag, Berlin, 1984), vol. 17, subvol. d, p. 255. S.R. Morrison, in Electrochemistry at Semiconductor and Oxidised Metal Electrodes (Plenum Press, New York, 1980). M. Büchler,P. Schmuki,H. Böhni,T. Stenberg,T. Mäntylä, J.Electrochem.Soc.145,378(1998).