Effect of heat treatment on electrical and surface properties of tungsten oxide thin films grown by HFCVD technique

Materials Science in Semiconductor Processing - Tập 122 - Trang 105506 - 2021
Guang-Lei Tan1, Dan Tang1, Davoud Dastan2, Azadeh Jafari3, José P.B. Silva4, Xi-Tao Yin5
1School of Materials Science and Engineering, Yingkou Institute of Technology, Yingkou, Liaoning Province, 115014, China
2School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA 30332, USA
3South Ural State University, 76, Lenin Aven., Chelyabinsk 454080, Russia
4Centre of Physics of University of Minho and Porto (CF-UM-UP), Campus de Gualtar, 4710-057, Braga, Portugal
5School of Physics and Optoelectronic Engineering, Ludong University, Yantai, Shandong Province, 264000, China

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