Prediction of concentration profile for P doping in Si gas-source molecular beam epitaxy

Journal of Crystal Growth - Tập 196 - Trang 115-121 - 1999
F. Hirose1, H. Sakamoto1
1Advanced Technology Research Center, Mitsubishi Heavy Industries, Ltd., 1-8-1, Sachiura, Kanazawa-ku, Yokohama, 236-8515, Japan

Tài liệu tham khảo

Nützel, 1995, J. Appl. Phys., 78, 937, 10.1063/1.360286 Jorke, 1988, Surf. Sci., 193, 569, 10.1016/0039-6028(88)90454-2 Copel, 1989, Phys. Rev. Lett., 63, 632, 10.1103/PhysRevLett.63.632 Xie, 1996, Surf. Sci., 367, 231, 10.1016/S0039-6028(96)00872-2 Hofmann, 1978, Surf. Sci., 77, 591, 10.1016/0039-6028(78)90143-7 Hirose, 1990, Jpn. J. Appl. Phys., 29, L1881, 10.1143/JJAP.29.L1881 Hirose, 1997, J. Crystal Growth, 179, 108, 10.1016/S0022-0248(97)00092-4 Barnett, 1986, Surf. Sci., 165, 303, 10.1016/0039-6028(86)90809-5 Hirose, 1991, J. Appl. Phys., 70, 5380, 10.1063/1.350220 Taylor, 1990, Surf. Sci., 238, 1, 10.1016/0039-6028(90)90060-L Kern, 1970, RCA Rev., 31, 187 F. Hirose, H. Sakamoto, in preparation.