In situ synchrotron stress mappings to characterize overload effects in fatigue crack growth

International Journal of Fatigue - Tập 121 - Trang 155-162 - 2019
M. Thielen1, F. Schaefer1, P. Gruenewald1, M. Laub1, M. Marx1, M. Meixner2, M. Klaus2, C. Motz1
1Dept. of Materials Science and Engineering, Saarland University, Germany
2Helmholtz-Zentrum, Berlin, Germany

Tài liệu tham khảo

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