Tungsten nitride thin films deposited by MOCVD: sources of carbon and effects on film structure and stoichiometry

Journal of Crystal Growth - Tập 261 - Trang 280-288 - 2004
Omar J. Bchir1, Kelly M. Green1, Mark S. Hlad1, Timothy J. Anderson1, Benjamin C. Brooks2, Lisa McElwee-White2
1Department of Chemical Engineering, University of Florida, P.O. Box 116005, Gainesville, FL 32611, USA
2Department of Chemistry, University of Florida, P.O. Box 117200, Gainesville, FL 32611-7200, USA

Tài liệu tham khảo

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