Proton radiation effects on high-speed silicon Mach-Zehnder modulators for space application

Springer Science and Business Media LLC - Tập 65 - Trang 1-12 - 2022
Changhao Han1, Zhaoyi Hu2, Yuansheng Tao1, Engang Fu2, Yandong He3, Fenghe Yang4, Jun Qin1, Xingjun Wang1,4,5,6
1State Key Laboratory of Advanced Optical Communication Systems and Networks, School of Electronics, Peking University, Beijing, China
2State Key Laboratory of Nuclear Physics and Technology, School of Physics, Peking University, Beijing, China
3Institute of Microelectronics, School of Integrated Circuits, Peking University, Beijing, China
4Peking University Yangtze Delta Institute of Optoelectronics, Nantong, China
5Frontier Science Center for Nano-optoelectronics, Peking University, Beijing, China
6Peng Cheng Laboratory, Shenzhen, China

Tóm tắt

In this paper, performance degradation effects on high-speed silicon Mach-Zehnder modulators under proton radiation were investigated for future space environment applications. The test devices were exposed to 3-MeV protons of three fluence levels (5 × 1013, 2 × 1014, and 5 × 1015 ions/cm2), which is comparable to the radiation amount for operating in a harsh space environment after several decades. The performance of the silicon modulator after radiation was characterized in terms of modulation efficiency and eye diagram. The results illustrate that the modulation efficiency is significantly reduced after proton radiation and shows an obvious decrease with increasing radiation fluence. The extinction ratios of the on-off keying (OOK) eye diagram are obviously dropped with increasing radiation fluence and correspond well to modulation efficiency degradation. Furthermore, three representative states for data transmission are demonstrated under three fluences, from still working to the critical state and eventually complete fail. Displacement damage and ionization damage are the two major mechanisms during proton radiation, which lead to the bulk defects and accumulating defect charges and cause performance degradation of silicon Mach-Zehnder modulators.

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