Preparation and characterization of indium tin oxide films formed by oxygen ion beam assisted deposition

Solid State Communications - Tập 126 - Trang 509-513 - 2003
C. Liu1,2, T. Mihara1, T. Matsutani1, T. Asanuma1, M. Kiuchi1
1National Institute of Advanced Industrial Science and Technology, Ikeda 563-8577, Japan
2Department of Physics, Wuhan University, Wuhan 430072, People's Republic of China

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