In situ monitoring of periodic structures during MOVPE of III-nitrides

Journal of Crystal Growth - Tập 310 - Trang 1607-1613 - 2008
C. Simbrunner1, A. Kharchenko2, A. Navarro-Quezada1, M. Wegscheider1, M. Quast1, Tian Li1, A. Bonanni1, J. Bethke2, K. Lischka3, H. Sitter1
1Institute of Semiconductor and Solid State Physics, University Linz, Austria
2PANalytical B.V., Almelo, The Netherlands
3Department of Physics, University of Paderborn, Germany

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