Tsong, 1971, J. chem. Phys., 54, 4205, 10.1063/1.1674660
and , Field Ion Microscopy, Principles and Applications, American Elsevier, New York 1969.
Ehrlich, 1966, J. chem. Phys., 44, 1039, 10.1063/1.1726787
Bassett, 1970, J. Phys. D (Appl. Phys.), 3, 707, 10.1088/0022-3727/3/5/309
Phys. Rev. B to be published on June 15, 1972.
Walko, 1972, phys. stat. sol. (a), 9, k9, 10.1002/pssa.2210090149
Tsong, 1971, J. chem. Phys., 55, 2884, 10.1063/1.1676510
Schmidt, 1971, Surface Sci., 28, 297, 10.1016/0039-6028(71)90128-2
McLane, 1971, Surface Sci., 27, 367, 10.1016/0039-6028(71)90043-4
Rendulic, 1971, Surface Sci., 28, 285, 10.1016/0039-6028(71)90100-2
Tsong, 1971, Surface Sci., 28, 651, 10.1016/0039-6028(71)90074-4
Forbes, 1971, Nature Phys. Sci., 280, 165, 10.1038/physci230165a0