In situ flaw detection by IR‐imaging during electron beam melting
Tóm tắt
The purpose of this paper is to investigate the possibility of
The authors compare infrared images (IR) which were taken during the generation of Ti‐6Al‐4V parts in a selective electron beam melting system (SEBM) with metallographic images taken from destructive material investigation.
A good match is found between the IR images and the material flaws detected by metallographic techniques.
First results are presented here, mechanisms of flaw formation and transfer between build layers are not addressed in detail.
This work has important implications for quality assurance in SEBM and rapid manufacturing in general.
Từ khóa
Tài liệu tham khảo
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